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LANGER EMV-Technik XFS-E 10 Scanner Probe (30 MHz - 6 GHz) | EMIN.COM.MM

EMI and EMC Test System
LANGER EMV-Technik XFS-E 10 Scanner Probe (30 MHz - 6 GHz)

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LANGER EMV-Technik XFS-E 10 Scanner Probe (30 MHz - 6 GHz)

ManufacturerLANGER EMV-Technik(View more products from this manufacturer)

ModelXFS-E 10

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Easy change and return

Delivery Available

Technical parameters

Frequency range: 30 MHz - 6 GHz

Probe head dimensions: ≈ (0.5 x 2) mm

Connector - output: SMA, male, plug

Resolution: ≈ 0.2 mm

Datasheet

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