Ophir Si/9/5μm Scanning Slit Beam Profiler With NanoScan (190-1100nm)
Manufacturer: Ophir Model: Si/9/5μm P/N: PH00465 - Contact
Wavelengths: 190-1100nm
Slit size: 5μm
Beam Sizes: 20μm-~6mm
Spatial sampling resolution: 5.3nm-18.3μm
Scan frequency: 1.25, 2.5, 5, 10, 20Hz
Bus Interface: USB 2.0
Sensor Type: Germanium
Compatible Light Sources: CW, Pulsed >25kHz
Power Range: ~10nW - ~10W
Aperture Size: 9mm
Scanhead Size: 83mm
Weight: 434g (15.3 ounces)
Operating temperature: 0-50ºC
Humidity: 90%, non-condensing
Scanhead dimensions: 76.8mm L x 63.5mm Ø
CPU clock: 300MHz
Memory clock: 264MHz
Compliance: CE, UKCA, China RoHS
NanoScan Standard: NS2s-Si/9/5-PRO
Details
- Quality Engagement
- Easy change and return
- Delivery Avaliable
- Favorable payment