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Instrument Type:Dual-beam spectrophotometer
Measurement Geometry:Diffuse illumination and 0º viewing in conformance with ISO 2469
Illumination Source:Pulsed xenon filtered to approximate D65
Sphere Diameter:152 mm/6.0 in
Spectral Analyzer:SPX analyzer with dual 256 diode array and high-resolution holographic grating
Wavelength Range:360 nm to 700 nm
Reporting Interval:10 nm
Photometric Range:0 to 200%
Photometric Resolution:0.003%
20 read repeatability on white tile using dual flash (CIELAB) (1):0.02 CIEL*a*b*(max)
Inter-instrument agreement: reflectance measurements (CIELAB) (1, 2 &3):0.4 (maximum excluding black tile) CIEL*a*b*, 0.25 (average) CIEL*a*b*
Sample Temperature:XLAV Aperture 34 mm illuminated and 30 mm measured
IR Sensor Accuracy:±0.9°F/ ±0.5°C
Lens:3-position, auto zoom
Aperture detection:Yes
Automated UV control:Automatic UV calibration for the measurement of fluorescent specimens with UV cutoff filters at 395 nm, 420 nm and 460 nm
UV cutoff filters:395nm, 420nm, 460nm
XLAV Aperture plate:34 mm illuminated and 30 mm measured
LAV Aperture plate (optional, sold separately):30mm illuminanted and 26 mm measured
SAV Aperture plate:9mm illuminated and 5 mm measured
USAV Aperture plate:6.5 mm illuminated and 2.5 mm measured
Remote Measurement button:Yes
Sample Positioning Camera:Yes
Vertical Mount:Yes
Functional Operating Environment (2):5º to 40º C, 5% to 85% non-condensing relative humidity
Physical Specifications:
Color Display:3.5 inch RGB LCD
Display Resolution:320 x 240 pixel resolution
Weight:24.7 kg / 54.5 lbs
Dimensions:25.0″/ 63.5 cm (Height) 12.2″/ 39.9 cm (Width) 16.3″/ 41.4 cm (Depth)
Power Requirements:100 to 240 VAC, 50/60 Hz, 80 VA
Power Requirements:100 – 240 VAC, Frequency 50/60 Hz, Power Rating: 80 VA
Data Interface:USB 2.0 / Ethernet
