Keysight Measurement Forum Hanoi – Diễn đàn đo lường Keysight (KMF)
Keysight Measurement Forum (KMF) is Keysight Technologies' annual event held across Southeast Asia to share technology trends and innovations in the industry. This forum brings new knowledge about 6G technology, advanced circuit design, and high-speed digital. This is a place to connect businesses and experts in the electronics and semiconductor value chain, to find solutions to challenges in the field of measurement and testing.
Contents
Time and location
Time: 8:00 – 14:00, Friday, November 15, 2024
Location: JW Marriott Hanoi Hotel (8 Do Duc Duc Street, Me Tri Ha Urban Area, Me Tri, Nam Tu Liem, Hanoi, Vietnam)
Exhibition group
This Keysight event includes 3 exhibition groups: Electronics Research and Manufacturing, 6G Technology Research, Network Validation and 5G Laboratory, Semiconductor Design and High-Speed Digital.
- Group 1: Research and Production of RF Electronic Equipment
Responding to the need for high-bandwidth AI applications and fast connectivity, this group introduces multi-port measurement methods and phase noise analysis, along with a new 2U signal generator supporting military communications and MIMO testing .
- Group 2: 6G, Network Validation and 5G Lab
Use the 6G Vector Component Analysis (VCA) method to develop and characterize 6G components approaching the THz frequency range. Learn how to simulate and test 5G NR NTN enabled devices. Prepare to test your newly installed 5G mobile network with the Nemo 5G field test and data analytics solution.
- Group 3: High Speed Digital and Semiconductor Design
From system simulation to device modeling, learn how to design efficiently using basic Semiconductor Electronics Design Automation software with the help of PDK generation and verification. Learn how to analyze power integrity across power distribution network (PDN) impedance, integrity of voltage levels, and control loop feedback.
Agenda của Keysight Measurement Forum
Thời gian & Hoạt động và chủ đề
08:00 – 08:30
Register and Demo exhibition booth
08:30 – 08:50
Introduction and Keynote – Takuya Furata (Senior Director, Asia Pacific Marketing)
08:50 – 09:30
Shared article 1: Navigating the 4 main pillars of 6G – Say Phommakesone (6G Application Scientist)
While 5G has only been deployed for three years with features in Rel-16 being integrated into commercial devices, research and visioning for 6G is progressing quite well. The move to 6G is driving the need for revolution in many technologies. This talk will also explore the four key pillars and the innovation needed to make this happen.
09:30 – 10:10
Sharing article 2: Essential EDA and design knowledge for the semiconductor ecosystem – Wai Kin Chua (Business Manager)
As Vietnam's semiconductor industry expands rapidly, integrated circuit (IC) design becomes increasingly important. We'll explore how Keysight EDA solutions contribute to the semiconductor design ecosystem and beyond. This presentation covers essential design knowledge and technologies, including MMIC/RFIC, system design, and advanced device modeling for the next generation semiconductor design flow.
10:10 – 10:50
Take a break and visit the demos
10:50 – 11:30
Sharing article 3: Method to create and analyze broadband signals for 5G & Satcom applications – Long Nguyen (Senior Solution Engineer)
This presentation focuses on sharing knowledge and techniques of receiver path optimization to analyze communication signals in 5G and broadband Satcom. Learn exciting technological methods such as reflectometry, EVM curves, and nonlinear distortion correction. By attending this session, you will have an advantage in choosing the right accessories to upgrade your 5G broadband testing.
11:30 – 12:10
Sharing article 4: The importance of new generation multi-port components and measurements using PXI VNA – Takuya Hirato (Product Manager)
In RF technology, Front-end modules (FEMs) used in multi-band operation and multiple-input, multiple-output (MIMO) antennas require multi-port specification for all all their components. Testing high-speed digital technologies like HDMI and USB 3.1 is even more demanding with multiple internal cables and connectors. However, these modules are still being tested as solutions based on switch designs are not enough to keep up with multi-port tests. This presentation highlights that VNA has been re-engineered and optimized for multi-port testing needs.
12:10 – 12:40
Sharing article 5: Confirming power integrity with an oscilloscope – Brian Yeo (Senior Solution Engineer)
Modern electronic power supply is more challenging than ever. Many different power levels plus power management integrated circuits (PMICs) can make design layout and final debugging/testing difficult when calculating operating power range amplitudes. . Gallium nitride (GaN) and silicon carbide (SiC) semiconductor devices have wide isolation ranges, fast switching, and high-current, multiphase designs that create low-impedance challenges that cannot be ignored. .
12:40 – 12:50
Keysight Measurement Forum closing keynote
12:50 – 14:30
Lunch and socializing
Registration deadline: Monday, November 10, 2024. Limited number of guests, register today!
